The ARL™ EQUINOX 100 X-ray Diffractometer this stand-alone, transportable benchtop instrument offers true flexibility. No external water cooling is required, and it plugs into a standard electrical power outlet. This instrument simplifies operation without sacrificing speed or performance. Thanks to a specific real-time detection mode, measurements are completed in a few seconds.
- Unique ARL EQUINOX curved detector measures all diffraction peaks simultaneously across a wide angular range. The analysis is completed in just a few minutes on most samples regardless of resolution requirements.
- Measurement in real time over 110° 2Ø
- No scanning required
- Micro-focus X-Ray source with a high-intensity optic
- No external water cooling and plugging into a standard power supply
- Many sample holders are available for powders in transmission and reflection mode, bulks, thin films, in-situ studies, as well as automated analysis thanks to a dedicated sample changer
- Easy to use and install in various environments: laboratory, mobile laboratory, van
- Treatment and applications: Phase identification, Quantification, Degree of crystallinity, Cell parameters, Crystallite size, Lattice strain, Crystal structure, Rietveld analysis, Transition phase, Thin film analysis (GIXRD, XRR)
- Domains of application: Materials Science, Minerals, Geology, Nanomaterials, Chemicals, Pharmaceuticals, Energy materials, Catalysts, Ceramics, Polymers, Metallurgy, Semiconductors, Mining (cement, …),